Keithley 2000/2000-SCAN: The industry’s most versatile source-measure unit with built-in scanner card capability, enabling simultaneous measurements on multiple devices or points on a single device.
Keithley 2100/230-240: High-Precision Source-Measure Unit for Advanced Characterization and Test Applications
Keithley 2306: The industry’s most accurate and versatile source measure unit, offering unmatched precision, speed, and flexibility for demanding test applications.
Keithley 2308: The industry’s most precise and versatile source measure unit, offering unmatched accuracy, speed, and flexibility for demanding test applications.
Keithley 2450 Graphical Series SourceMeter SMU: 4-quadrant source and measure unit 1000V/1A/100W output 0.012% basic accuracy 5.5-digit resolution* Built-in graphical display and data logging
Keithley 2510 TEC SourceMeter: Source and measure current and voltage Generate temperature setpoints Control TEC devices Automate testing with built-in software
Keithley 2510-AT TEC SourceMeter: High-power TEC controller with 10 A/100 V output Precision temperature measurement and control Built-in LabVIEW driver for easy programming Ideal for testing and characterizing thermoelectric coolers
Keithley 2611B Single Channel SourceMeter, 200 V, 10 A Pulse: Source and measure voltage and current Pulse current and voltage High power: 200 V, 10 A High accuracy: 0.01% Fast measurement speed: 1000 readings/s
Keithley 2636B SourceMeter SMU Instrument: 6-channel, 20W SMU with 10A/100V capability High-speed sourcing and measurement Built-in arbitrary waveform generator Advanced triggering and sequencing* Intuitive user interface and remote control
Keysight 16089C Kelvin IC Clip Leads: Precision Kelvin clip leads for accurate and reliable measurements in IC testing and characterization applications.
Keysight 34420A Nanovolt/Micro-Ohm Meter: Measure with Precision – 7.5 Digit Resolution, Nanovolt Sensitivity, Micro-Ohm Resistance Measurement
Keysight B2987A: Precision Source/Measure Unit for Advanced Semiconductor Testing, featuring high accuracy, low noise, and fast transient response for precise characterization and validation of semiconductor devices.